Tetramethylammoniumhydroxid 25% in wässriger Lösung, Finyte® für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
|
Gefahr
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5879-03EA
213
CHF
5879-03
Tetramethylammoniumhydroxid 25% in wässriger Lösung, Finyte® für Mikroelektronik, J.T.Baker®
Tetramethylammonium hydroxide
Formel:
C₄H₁₃NO MW: 91,15 g/mol Siedepunkt: 110 °C (1013 hPa) Dichte: 1,02 g/cm³ (20 °C) Lager Temperatur: Raumtemperatur |
MDL Number:
MFCD00008280 EINECS: 200-882-9 UN: 1835 ADR: 8,II |
Spezifikation Testergebnisse
For Microelectronic Use | |
Assay (C₄H₁₃NO) (by acid-base titration) | 24.5 - 25.5 % |
Carbonate (CO₃) | ≤100 ppm |
Color (APHA) | ≤10 |
Halide (as Cl) | ≤5 ppm |
Trace Impurities - Aluminum (Al) | ≤3.5 ppb |
Trace Impurities - Barium (Ba) | ≤2.0 ppb |
Trace Impurities - Boron (B) | ≤10.2 ppb |
Trace Impurities - Boron (FUT) | ≤10.2 ppb |
Trace Impurities - Boron (B) (Sub-supplier) | ≤2.0 ppb |
Trace Impurities - Calcium (Ca) | ≤7.5 ppb |
Trace Impurities - Chromium (Cr) | ≤2.0 ppb |
Trace Impurities - Cobalt (Co) | ≤1.3 ppb |
Trace Impurities - Copper (Cu) | ≤2.0 ppb |
Trace Impurities - Iron (Fe) | ≤2.7 ppb |
Trace Impurities - Lead (Pb) | ≤1.4 ppb |
Trace Impurities - Lithium (Li) | ≤2.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤1.7 ppb |
Trace Impurities - Manganese (Mn) | ≤1.7 ppb |
Trace Impurities - Nickel (Ni) | ≤1.3 ppb |
Trace Impurities - Potassium (K) | ≤2.8 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤5.6 ppb |
Trace Impurities - Tin (Sn) | ≤1.7 ppb |
Trace Impurities - Titanium (Ti) | ≤1.9 ppb |
Trace Impurities - Zinc (Zn) | ≤2.3 ppb |
Particle Count at point of fill - 1.0 µm and greater | ≤25 par/ml |
Particle Count at point of fill - 0.5 µm and greater | ≤400 par/ml |
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