N-Methyl-2-pyrrolidon (NMP), ALEG® für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
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Gefahr
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6397-05EA
196
CHF
6397-05
N-Methyl-2-pyrrolidon (NMP), ALEG® für Mikroelektronik, J.T.Baker®
N-Methyl-2-pyrrolidon (NMP)
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Formel:
C₅H₉NO MW: 99,13 g/mol Siedepunkt: 202 °C (1013 hPa) Melting Pt: –24 °C Dichte: 1,033 g/cm³ (20 °C) Flash-Pt: 91 °C Lager Temperatur: Raumtemperatur |
MDL Number:
MFCD00003193 CAS-Nummer: 872-50-4 EINECS: 212-828-1 Merck Index: 13,06140 |
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Spezifikation Testergebnisse
| For Microelectronic Use | |
| Assay (C₅H₉NO) | ≥99.5 % |
| Color (APHA) | ≤20 |
| Water (H₂O)(by Karl Fischer titrn) | ≤0.05 % |
| Free Amines (as CH₃NH₂) | ≤50 ppm |
| Chloride (Cl) | ≤0.5 ppm |
| Phosphate (PO₄) | ≤1 ppm |
| Trace Impurities - Aluminum (Al) | ≤100.0 ppb |
| Arsenic and Antimony (as As) | ≤100.0 ppb |
| Trace Impurities - Barium (Ba) | ≤100.0 ppb |
| Trace Impurities - Boron (B) | ≤100.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤300 ppb |
| Trace Impurities - Chromium (Cr) | ≤100.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤100.0 ppb |
| Trace Impurities - Copper (Cu) | ≤100.0 ppb |
| Trace Impurities - Gold (Au) | ≤100.0 ppb |
| Trace Impurities - Iron (Fe) | ≤100.0 ppb |
| Trace Impurities - Lead (Pb) | ≤100 ppb |
| Trace Impurities - Lithium (Li) | ≤100.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤100.0 ppb |
| Trace Impurities - Manganese (Mn) | ≤100.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤100.0 ppb |
| Trace Impurities - Potassium (K) | ≤100 ppb |
| Trace Impurities - Silver (Ag) | ≤100.0 ppb |
| Trace Impurities - Sodium (Na) | ≤300 ppb |
| Trace Impurities - Strontium (Sr) | ≤100.0 ppb |
| Trace Impurities - Tin (Sn) | ≤100 ppb |
| Trace Impurities - Titanium (Ti) | ≤100.0 ppb |
| Trace Impurities - Vanadium (V) | ≤100.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤100.0 ppb |
| Particle Count - 1.0 µm and greater (Rion KS42AF) | ≤10 par/ml |
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