N-Methyl-2-pyrrolidon (NMP), Finyte® für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
6347-09EA
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CHF
6347-09
N-Methyl-2-pyrrolidon (NMP), Finyte® für Mikroelektronik, J.T.Baker®
N-Methyl-2-pyrrolidon (NMP)
Formel:
C₅H₉NO MW: 99,13 g/mol |
MDL Number:
MFCD00003193 CAS-Nummer: 872-50-4 |
Spezifikation Testergebnisse
For Microelectronic Use | |
Assay (C₅H₉NO) | ≥99.8 % |
Color (APHA) | ≤30 |
Water (H₂O)(by Karl Fischer titrn) | ≤300 ppm |
Free Amines (as CH₃NH₂) | ≤50 ppm |
Chloride (Cl) | ≤0.5 ppm |
Phosphate (PO₄) | ≤1 ppm |
Trace Impurities - Aluminum (Al) | ≤10.0 ppb |
Arsenic and Antimony (as As) | ≤10.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤10.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤10.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
Trace Impurities - Gold (Au) | ≤10.0 ppb |
Trace Impurities - Iron (Fe) | ≤10.0 ppb |
Trace Impurities - Lead (Pb) | ≤10.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤10.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤10.0 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤10.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤10.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤10.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count at point of fill - 0.3 µm and greater (Rion KS42AF) | |
Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF) | ≤400 par/ml |
Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF) | ≤25 par/ml |
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