Ammoniaklösung 29%, CMOS für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
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Gefahr
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9741-09EA
0
CHF
9741-09
9741-15
Ammoniaklösung 29%, CMOS für Mikroelektronik, J.T.Baker®
Ammoniaklösung
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Formel:
NH₃ Siedepunkt: 32…37.7 °C (1013 hPa) Melting Pt: –60…–57.5 °C Dichte: 0.88…0.91 g/cm³ (20 °C) Lager Temperatur: Raumtemperatur |
MDL Number:
MFCD00066650 CAS-Nummer: 1336-21-6 EINECS: 215-647-6 UN: 2672 ADR: 8,III |
Spezifikation Testergebnisse
| For Microelectronic Use | Passes Test |
| Appearance | Passes Test |
| Assay (as NH₃) | 28.0 - 30.0 % |
| Color (APHA) | ≤7 |
| Insoluble Matter | ≤1 ppm |
| Residue after Ignition | ≤3 ppm |
| Carbon Dioxide (CO₂) | ≤10 ppm |
| Pyridine | Passes Test |
| Substances Reducing Permanganate | Passes Test |
| Chloride (Cl) | ≤0.3 ppm |
| Phosphate (PO₄) | ≤0.20 ppm |
| Total Sulfur (as SO₄) | ≤0.8 ppm |
| Trace Impurities - Aluminum (Al) | ≤10.0 ppb |
| Arsenic and Antimony (as As) | ≤30.0 ppb |
| Trace Impurities - Barium (Ba) | ≤10.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
| Trace Impurities - Boron (B) | ≤10.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤5.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤100.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤5.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤1.0 ppb |
| Trace Impurities - Copper (Cu) | ≤10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
| Trace Impurities - Germanium (Ge) | ≤50.0 ppb |
| Trace Impurities - Gold (Au) | ≤10.0 ppb |
| Heavy Metals (as Pb) | ≤200.0 ppb |
| Trace Impurities - Iron (Fe) | ≤10.0 ppb |
| Trace Impurities - Lead (Pb) | ≤10.0 ppb |
| Trace Impurities - Lithium (Li) | ≤10.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤50.0 ppb |
| Trace Impurities - Manganese (Mn) | ≤5.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤5.0 ppb |
| Trace Impurities - Niobium (Nb) | ≤10.0 ppb |
| Trace Impurities - Potassium (K) | ≤100 ppb |
| Trace Impurities - Silicon (Si) | ≤150.0 ppb |
| Trace Impurities - Silver (Ag) | ≤5.0 ppb |
| Trace Impurities - Sodium (Na) | ≤100.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤20.0 ppb |
| Trace Impurities - Tin (Sn) | ≤20.0 ppb |
| Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
| Trace Impurities - Vanadium (V) | ≤10.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤5.0 ppb |
| Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
| Particle Count at point of fill - 0.5 µm and greater | ≤100 par/ml |
| Particle Count at point of fill - 1.0 µm and greater | ≤25 par/ml |
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