Aceton, CMOS für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
|
Gefahr
|
Synonyms:
DMK
, Dimethylketon
, Propanon
, 2-Propanon
9015-10EA
0
CHF
9015-10
9015-09
9015-2J
Aceton, CMOS für Mikroelektronik, J.T.Baker®
Aceton
|
Formel:
CH₃COCH₃ MW: 58,08 g/mol Siedepunkt: 56,2 °C (1013 hPa) Melting Pt: –95,4 °C Dichte: 0,792 g/cm³ (20 °C) Flash-Pt: <–20 °C (geschlossener Tiegel) Lager Temperatur: Raumtemperatur |
MDL Number:
MFCD00008765 CAS-Nummer: 67-64-1 EINECS: 200-662-2 UN: 1090 ADR: 3,II REACH: 01-2119471330-49 Merck Index: 13,00067 |
|
Spezifikation Testergebnisse
| For Microelectronic Use | |
| Assay ((CH₃)₂CO) (by GC, corrected for water) | ≥ 99.5 % |
| Color (APHA) | ≤ 10 |
| Residue after Evaporation | ≤ 5 ppm |
| Titrable Acid (µeq/g) | ≤ 0.3 |
| Titrable Base (µeq/g) | ≤ 0.5 |
| Water (H₂O) | ≤ 0.5 % |
| Solubility in H₂O | Passes Test |
| Chloride (Cl) | ≤ 0.2 ppm |
| Phosphate (PO₄) | ≤ 0.05 ppm |
| Trace Impurities - Aluminum (Al) | ≤ 50.0 ppb |
| Arsenic and Antimony (as As) | ≤ 5.0 ppb |
| Trace Impurities - Barium (Ba) | ≤ 20.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤ 10.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤ 20.0 ppb |
| Trace Impurities - Boron (B) | ≤ 10.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤ 10.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤ 25.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤ 10.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤ 10.0 ppb |
| Trace Impurities - Copper (Cu) | ≤ 10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤ 10.0 ppb |
| Trace Impurities - Germanium (Ge) | ≤ 10.0 ppb |
| Trace Impurities - Gold (Au) | ≤ 20 ppb |
| Trace Impurities - Iron (Fe) | ≤ 20.0 ppb |
| Trace Impurities - Lead (Pb) | ≤ 10.0 ppb |
| Trace Impurities - Lithium (Li) | ≤ 10.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤ 20 ppb |
| Trace Impurities - Manganese (Mn) | ≤ 10.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤ 10.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤ 10.0 ppb |
| Trace Impurities - Niobium (Nb) | ≤ 50.0 ppb |
| Trace Impurities - Potassium (K) | ≤ 10.0 ppb |
| Trace Impurities - Silicon (Si) | ≤ 50 ppb |
| Trace Impurities - Silver (Ag) | ≤ 10.0 ppb |
| Trace Impurities - Sodium (Na) | ≤ 10.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤ 10.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤ 50.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤ 10.0 ppb |
| Trace Impurities - Tin (Sn) | ≤ 20.0 ppb |
| Trace Impurities - Titanium (Ti) | ≤ 10.0 ppb |
| Trace Impurities - Vanadium (V) | ≤ 10.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤ 20.0 ppb |
| Trace Impurities - Zirconium (Zr) | ≤ 10.0 ppb |
| Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF or equivalent) | ≤ 150 par/ml |
| Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF or equivalent) | ≤ 25 par/ml |
Learn more
About VWR
Avantor is a vertically integrated, global supplier of discovery-to-delivery solutions for...