Ammoniumfluorid 40% in wässriger Lösung, CMOS für Mikroelektronik, J.T.Baker®
Lieferant: Avantor
|
Gefahr
|
0702-05EA
76.2
CHF
0702-05
Ammoniumfluorid 40% in wässriger Lösung, CMOS für Mikroelektronik, J.T.Baker®
Ammonium fluoride
|
Formel:
NH₄F MW: 37,04 g/mol Lager Temperatur: Raumtemperatur |
MDL Number:
MFCD00011423 CAS-Nummer: 12125-01-8 EINECS: 235-185-9 UN: 3287 ADR: 6.1,III |
Spezifikation Testergebnisse
| For Microelectronic Use | |
| Assay (NH₄F) | 39.0 - 41.0 % |
| Color (APHA) | ≤10 |
| pH of 1% Solution at 25°C | 6.0 - 7.5 |
| Residue after Ignition | ≤5 ppm |
| Chloride (Cl) | ≤2 ppm |
| Insoluble Matter | ≤0.5 ppm |
| Nitrate (NO₃) | ≤5 ppm |
| Oxidizable Species (as SO₃) | ≤1 ppm |
| Phosphate (PO₄) | ≤0.20 ppm |
| Sulfate (SO₄) | ≤1 ppm |
| Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
| Trace Impurities - Antimony (Sb) | ≤10.0 ppb |
| Trace Impurities - Arsenic (As) | ≤20.0 ppb |
| Arsenic and Antimony (as As) | ≤30.0 ppb |
| Trace Impurities - Barium (Ba) | ≤10.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤5.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤50 ppb |
| Trace Impurities - Boron (B) | ≤20.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤20.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤10.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
| Trace Impurities - Copper (Cu) | ≤10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤50 ppb |
| Trace Impurities - Germanium (Ge) | ≤40.0 ppb |
| Trace Impurities - Gold (Au) | ≤20 ppb |
| Heavy Metals (as Pb) | ≤500.0 ppb |
| Trace Impurities - Iron (Fe) | ≤50.0 ppb |
| Trace Impurities - Lead (Pb) | ≤50 ppb |
| Trace Impurities - Lithium (Li) | ≤10.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤10.0 ppb |
| Trace Impurities - Manganese (Mn) | ≤20.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤50.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤50 ppb |
| Trace Impurities - Niobium (Nb) | ≤20.0 ppb |
| Trace Impurities - Potassium (K) | ≤100 ppb |
| Trace Impurities - Silver (Ag) | ≤10.0 ppb |
| Trace Impurities - Sodium (Na) | ≤50.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤50.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤20.0 ppb |
| Trace Impurities - Tin (Sn) | ≤50 ppb |
| Trace Impurities - Titanium (Ti) | ≤50.0 ppb |
| Trace Impurities - Vanadium (V) | ≤10.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
| Trace Impurities - Zirconium (Zr) | ≤5.0 ppb |
| Particle Count - 0.5 µm and greater | ≤100 par/ml |
| Particle Count - 1.0 µm and greater | ≤25 par/ml |
| Reported value is the average of all samples counted for this lot number,with no individual sample value exceeding the specification. |
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